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Super High Resolution Darkfield Scattering-Confocal Raman Microscope · FederalPipeline

Super High Resolution Darkfield Scattering-Confocal Raman Microscope

Sources Sought from National Institute of Standards and Technology, solicitation NIST-SS25-CHIPS-0007. Responses due Nov 1, 2024. NAICS 334516. Listed on SAM.gov.

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