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CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation · FederalPipeline

CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation

Combined Synopsis/Solicitation from National Institute of Standards and Technology, solicitation 1333ND26QNB030236. Responses due Sep 9, 2026. NAICS 334519. Listed on SAM.gov.

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